Spectroscopic Ellipsometry as a Complementary Tool to Characterize Coatings on PDMS for CE Applications
Tomas E. Benavidez and Carlos D. Garcia Electrophoresis 37 (2016) 2509 – 2516
Tomas E. Benavidez and Carlos D. Garcia Electrophoresis 37 (2016) 2509 – 2516